12 results
Oxide Impurities in Silicon Oxide Intermetal Dielectrics and Their Potential to Elevate Via-Resistances
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue 4 / August 2014
- Published online by Cambridge University Press:
- 12 May 2014, pp. 1271-1275
- Print publication:
- August 2014
-
- Article
- Export citation
Sample Preparation for Precise and Quantitative Electron Holographic Analysis of Semiconductor Devices
-
- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue 4 / August 2006
- Published online by Cambridge University Press:
- 14 July 2006, pp. 295-301
- Print publication:
- August 2006
-
- Article
- Export citation
Transmission Electron Microscopy Studies of Strained Si CMOS
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 864 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, E4.31
- Print publication:
- 2005
-
- Article
- Export citation
Materials and Physical Properties of Novel High-k and Medium-k Gate Dielectrics
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 670 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, K1.1
- Print publication:
- 2001
-
- Article
- Export citation
Microstructure Analysis of Barium Strontium Titanate Thin Film
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 523 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 187
- Print publication:
- 1998
-
- Article
- Export citation
Characteristics of spin-on ferroelectric SrBi2Ta2O9 thin film capacitors for ferroelectric random access memory applications
-
- Journal:
- Journal of Materials Research / Volume 11 / Issue 5 / May 1996
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1065-1068
- Print publication:
- May 1996
-
- Article
- Export citation
Polycrystalline Grain Structure of Sputtered Aluminum Nitride Films
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 343 / 1994
- Published online by Cambridge University Press:
- 15 February 2011, 753
- Print publication:
- 1994
-
- Article
- Export citation
The Effect of Tungsten on the Nucleation and Growth of thin Aluminum Alloy Films
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 317 / 1993
- Published online by Cambridge University Press:
- 15 February 2011, 227
- Print publication:
- 1993
-
- Article
- Export citation
Defect-Characterization in Implanted Locos + Trench-Isolated Structures
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 239 / 1991
- Published online by Cambridge University Press:
- 22 February 2011, 69
- Print publication:
- 1991
-
- Article
- Export citation
Microstructural Characterization of SiGe Heterolayers
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 239 / 1991
- Published online by Cambridge University Press:
- 22 February 2011, 437
- Print publication:
- 1991
-
- Article
- Export citation
A Comparison of RTO and Furnace Oxides
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 92 / 1987
- Published online by Cambridge University Press:
- 28 February 2011, 115
- Print publication:
- 1987
-
- Article
- Export citation
Sausage-skin problems for finite coverings
-
- Journal:
- Mathematika / Volume 31 / Issue 1 / June 1984
- Published online by Cambridge University Press:
- 26 February 2010, pp. 117-136
- Print publication:
- June 1984
-
- Article
- Export citation